Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Marquis, Emmanuelle A.
Bachhav, Mukesh
Chen, Yimeng
Dong, Yan
Gordon, Lyle M.
and
McFarland, Adam
2013.
On the current role of atom probe tomography in materials characterization and materials science.
Current Opinion in Solid State and Materials Science,
Vol. 17,
Issue. 5,
p.
217.
Miller, M.K.
and
Yao, L.
2013.
Limits of detectability for clusters and solute segregation to grain boundaries.
Current Opinion in Solid State and Materials Science,
Vol. 17,
Issue. 5,
p.
203.
Larson, David J.
Prosa, Ty J.
Ulfig, Robert M.
Geiser, Brian P.
and
Kelly, Thomas F.
2013.
Local Electrode Atom Probe Tomography.
p.
55.
Ceguerra, Anna V.
Breen, Andrew J.
Stephenson, Leigh T.
Felfer, Peter J.
Araullo-Peters, Vicente J.
Liddicoat, Peter V.
Cui, XiangYuan
Yao, Lan
Haley, Daniel
Moody, Michael P.
Gault, Baptiste
Cairney, Julie M.
and
Ringer, Simon P.
2013.
The rise of computational techniques in atom probe microscopy.
Current Opinion in Solid State and Materials Science,
Vol. 17,
Issue. 5,
p.
224.
Beleggia, M.
Kasama, T.
Larson, D. J.
Kelly, T. F.
Dunin-Borkowski, R. E.
and
Pozzi, G.
2014.
Towards quantitative off-axis electron holographic mapping of the electric field around the tip of a sharp biased metallic needle.
Journal of Applied Physics,
Vol. 116,
Issue. 2,
Miller, Michael K.
and
Forbes, Richard G.
2014.
Atom-Probe Tomography.
p.
259.
Zhou, Lin
Miller, M.K.
Lu, Ping
Ke, Liqin
Skomski, R.
Dillon, H.
Xing, Q.
Palasyuk, A.
McCartney, M.R.
Smith, D.J.
Constantinides, S.
McCallum, R.W.
Anderson, I.E.
Antropov, V.
and
Kramer, M.J.
2014.
Architecture and magnetism of alnico.
Acta Materialia,
Vol. 74,
Issue. ,
p.
224.
Breen, Andrew J.
Xie, Kelvin Y.
Moody, Michael P.
Gault, Baptiste
Yen, Hung-Wei
Wong, Christopher C.
Cairney, Julie M.
and
Ringer, Simon P.
2014.
Resolving the Morphology of Niobium Carbonitride Nano-Precipitates in Steel Using Atom Probe Tomography.
Microscopy and Microanalysis,
Vol. 20,
Issue. 4,
p.
1100.
Meher, S.
Nandwana, P.
Rojhirunsakool, T.
Tiley, J.
and
Banerjee, R.
2015.
Probing the crystallography of ordered Phases by coupling of orientation microscopy with atom probe tomography.
Ultramicroscopy,
Vol. 148,
Issue. ,
p.
67.
Mühlbacher, M.
Mendez-Martin, F.
Sartory, B.
Schalk, N.
Keckes, J.
Lu, J.
Hultman, L.
and
Mitterer, C.
2015.
Copper diffusion into single-crystalline TiN studied by transmission electron microscopy and atom probe tomography.
Thin Solid Films,
Vol. 574,
Issue. ,
p.
103.
Breen, Andrew J.
Moody, Michael P.
Ceguerra, Anna V.
Gault, Baptiste
Araullo-Peters, Vicente J.
and
Ringer, Simon P.
2015.
Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioning.
Ultramicroscopy,
Vol. 159,
Issue. ,
p.
314.
Lefebvre, W.
Hernandez-Maldonado, D.
Moyon, F.
Cuvilly, F.
Vaudolon, C.
Shinde, D.
and
Vurpillot, F.
2015.
HAADF–STEM atom counting in atom probe tomography specimens: Towards quantitative correlative microscopy.
Ultramicroscopy,
Vol. 159,
Issue. ,
p.
403.
Moody, Michael P.
Vella, Angela
Gerstl, Stephan S.A.
and
Bagot, Paul A.J.
2016.
Advances in atom probe tomography instrumentation: Implications for materials research.
MRS Bulletin,
Vol. 41,
Issue. 1,
p.
40.
Khan, Mansoor Ali
Ringer, Simon P.
and
Zheng, Rongkun
2016.
Atom Probe Tomography on Semiconductor Devices.
Advanced Materials Interfaces,
Vol. 3,
Issue. 12,
Lefebvre-Ulrikson, W.
Da Costa, G.
Rigutti, L.
and
Blum, I.
2016.
Atom Probe Tomography.
p.
279.
Marceau, R. K. W.
2016.
Atomic-scale analysis of light alloys using atom probe tomography.
Materials Science and Technology,
Vol. 32,
Issue. 3,
p.
209.
Hayashida, Misa
and
Malac, Marek
2016.
Practical electron tomography guide: Recent progress and future opportunities.
Micron,
Vol. 91,
Issue. ,
p.
49.
Lefebvre-Ulrikson, W.
2016.
Atom Probe Tomography.
p.
319.
Melkonyan, D.
Fleischmann, C.
Arnoldi, L.
Demeulemeester, J.
Kumar, A.
Bogdanowicz, J.
Vurpillot, F.
and
Vandervorst, W.
2017.
Atom probe tomography analysis of SiGe fins embedded in SiO 2 : Facts and artefacts.
Ultramicroscopy,
Vol. 179,
Issue. ,
p.
100.
Kelly, Thomas F.
2017.
Atomic-Scale Analytical Tomography.
Microscopy and Microanalysis,
Vol. 23,
Issue. 1,
p.
34.