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Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

  • KJ Hayworth (a1), N Kasthuri (a2), R Schalek (a2) and JW Lichtman (a2)


Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005



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