Skip to main content Accessibility help
×
Home

Automating the Collection of Ultrathin Serial Sections for Large Volume TEM Reconstructions

  • KJ Hayworth (a1), N Kasthuri (a2), R Schalek (a2) and JW Lichtman (a2)

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Copyright

Metrics

Altmetric attention score

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed