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The Benefits of Correlative Scanning Electron - and Confocal Raman Microscopy for the Characterization of Polymers, 2D Materials and Lithium Oxides

Published online by Cambridge University Press:  05 August 2019

Ute Schmidt ,
Wei Liu ,
David Steinmetz  and
Stefanie Freitag
Ute Schmidt*
Affiliation:
WITec GmbH, Ulm, Germany.
Wei Liu
Affiliation:
WITec Instruments Corp., Knoxwille, Tennessee, USA.
David Steinmetz
Affiliation:
WITec GmbH, Ulm, Germany.
Stefanie Freitag
Affiliation:
Carl Zeiss Microscopy GmbH, Munich, Germany.
*
*Corresponding author: Ute.Schmidt@witec.de

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1758 - 1759
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Frey, MD in “Scanning Microscopy for Nanotechnology”, ed. Zhou, W, Wang, ZL (Springer, New York) p. 101.Google Scholar
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[3]“Confocal Raman Microscopy” ed. Toporski, J, Dieing, T, Hollricher, O (Springer, Heidelberg).Google Scholar
[4]Schmidt, U et al. , Microsc. Microanal. 21 (2015), p. 2189.Google Scholar
[5]Schmidt, U et al. , Microsc. Microanal 23 (2017), p. 1748.Google Scholar
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[8]Freitag, S et al. , White paper in preparation.Google Scholar