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Challenges of Oversimplifying Z-contrast in Atomic Resolution ADF-STEM

Published online by Cambridge University Press:  25 July 2016

Ryan J. Wu ,
Michael L. Odlyzko  and
K. Andre Mkhoyan
Ryan J. Wu
Affiliation:
Department of Chemical Engineering and Material Science, University of Minnesota, MN, USA
Michael L. Odlyzko
Affiliation:
Department of Chemical Engineering and Material Science, University of Minnesota, MN, USA
K. Andre Mkhoyan
Affiliation:
Department of Chemical Engineering and Material Science, University of Minnesota, MN, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 946 - 947
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Williams, D.B. & Carter, C.B. Transmission Electron Microscopy: A Textbook for Materials Science, (2nd Edition) , (Springer, New York) (2009).CrossRefGoogle Scholar
[2] Odlyzko, M.L. “Surprising microscopy subtleties: measuring picoscale thicknesses, visualizing core orbitals, and detecting charge transfer using the TEM”, PhD Thesis, (University of Minnesota, 2015).Google Scholar
[3] Kirkland, E.J. Advanced Computing in Electron Microscopy, 2nd edition , (Springer, New York) (2010).Google Scholar
[4] Voyles, P.M., Muller, D.A. & Kirkland, E.J. Microscopy and Microanalysis 10 (2004). p. 291.Google Scholar
[5] Maccagnano-Zacher, S.E., et al, Ultramicroscopy 108 (2008). p. 718.CrossRefGoogle Scholar
[6] This work was supported in part by C-SPIN, one of the six centers of STARnet, a Semiconductor Research Corporation program, sponsored by MARCO and DARPA. We also acknowledge receiving access to computational resources from the University of Minnesota Supercomputing Institute.Google Scholar