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Characterization of Interfaces and Defects in Multiferroic Aurivillius Phase Thin Films by STEM and EELS-SI

Published online by Cambridge University Press:  22 July 2022

Núria Bagués ,
Louise Colfer ,
Michael Schmidt ,
Lynette Keeney  and
David W. McComb
Núria Bagués*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
Louise Colfer
Affiliation:
Advanced Materials and Surfaces Group, Tyndall National Institute, University College Cork, Lee Maltings Complex, Dyke Parade, Ireland
Michael Schmidt
Affiliation:
Advanced Materials and Surfaces Group, Tyndall National Institute, University College Cork, Lee Maltings Complex, Dyke Parade, Ireland
Lynette Keeney
Affiliation:
Advanced Materials and Surfaces Group, Tyndall National Institute, University College Cork, Lee Maltings Complex, Dyke Parade, Ireland
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA Dept. of Material Science and Engineering, Ohio State University, Columbus, Ohio 43212, US
*
*Corresponding author: baguessalguero.2@osu.edu

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2378 - 2380
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Copyright
Copyright © Microscopy Society of America 2022

References

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The authors acknowledge funding from TNI-OSU/IMR Catalyst-Pilot Program Award. Funding from the Royal Society and Science Foundation Ireland University Research Fellowship URF\R\201008 and Enhancement Award RGF\EA\180206 is gratefully acknowledged. The Electron microscopy was performed at the Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University.Google Scholar