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Characterization of Materials at the Nanoscale Using Hard X-ray Microspectroscopy Techniques

  • Gema Martinez-CriadGema Martínez-Criado (a1) (a2), Rémi Tucoulou (a2), Julie Villanova (a2), Damien Salomon (a2) and Sylvain Labouré (a2)...
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Abstract
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Corresponding author
* Corresponding author, gema.martinez.criado@csic.es
References
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[1] Rice, G E, et al, Science 334 2011 1234.
[2] Martinez-Criado, G in Chapter: Application of Micro and Nanobeams for Materials Science" in book: Synchrotron Light Sources and Free-Electron Lasers eds.E. Jaeschke, S. Khan, J.R. Schneider and J.B. Hastings Springer International Publishing p. 1505.
[3] Mino, L, et al, Reviews of Modern Physics 2018) in press.
[4] Tucoulou, R, et al, J. Synchrotron Rad 15 2008 392.
[5] Luo, Y, et al, Advanced Materials 29 2017 1703451.
[6] Salomon, D, et al, Nano Letters 17 2017 946.
[7] Yoneda, H, et al, Nature Communications 5 2014 5080.
G. Martinez-Criado has been partially supported by the ESRF, CSIC & MINECO (EUIN-2017-88844)..
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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