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Characterization of Various Interfaces Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  23 September 2015

Y. Zheng ,
R. E. A. Williams  and
H. L. Fraser
Y. Zheng
Affiliation:
Department of Materials Science and Engineering, The Ohio State University
R. E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University
H. L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1517 - 1518
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Shi, R., et al., Acta Materialia 60 (2012), p 4172–4184.Google Scholar
[2] Nag, S., et al., Acta Materialia 60 (2012), p 6247–6256.CrossRefGoogle Scholar
[3] Zheng, Y., et al., Acta Materialia (in preparation.Google Scholar
[4] Zheng., Y., et al., Acta Materialia (in preparation.Google Scholar