Hostname: page-component-8448b6f56d-qsmjn Total loading time: 0 Render date: 2024-04-24T18:34:24.931Z Has data issue: false hasContentIssue false

Comprehensive Quantitative Elemental Microanalysis with Electron-Excited Energy Dispersive X-ray Spectrometry (EDS): 50 Years Young and Getting Better Every Day!

Published online by Cambridge University Press:  01 August 2018

Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Fitzgerald, R., KeilR., K. R., K. Heinrich, K. Science 525 1968) p. 159.Google Scholar
[2] Goldstein, J., etal in “Scanning Electron Microscopy and X-ray Microanalysis, 4th ed Springer New York.Google Scholar
[3] Xiaobing, L., et al, Micros. Microanal 19(S2 2013) p. 1136.Google Scholar
[4] Newbury, D. Ritchie, N. J. Mats. Sci. 50 2015) p. 493.Google Scholar
[5] Newbury, D. Ritchie, N. Micros. Microanal 21 2015) p. 1327.Google Scholar
[6] Newbury, D. Ritchie, N. Micros. Microanal 22 2016) p. 520.Google Scholar
[7] Ritchie, N., Newbury, D. Davis, J. Micros. Microanal 18 2012) p. 892.Google Scholar
[8] Newbury, D. Ritchie, N. Micros. Microanal 22 2016) p. 735.Google Scholar
[9] Newbury, D. Ritchie, N. Micros. Microanal 22(S2 2016) p. 396.Google Scholar
[10] Ritchie, N. DTSA-II available free at: www.cstl .nist. gov/div837/837. 02/epq/dtsa2/index.html.Google Scholar