Skip to main content
×
Home
    • Aa
    • Aa

Compton Scattering Artifacts in Electron Excited X-Ray Spectra Measured with a Silicon Drift Detector

  • Nicholas W.M. Ritchie (a1), Dale E. Newbury (a1) and Abigail P. Lindstrom (a1)
Abstract
Abstract

Artifacts are the nemesis of trace element analysis in electron-excited energy dispersive X-ray spectrometry. Peaks that result from nonideal behavior in the detector or sample can fool even an experienced microanalyst into believing that they have trace amounts of an element that is not present. Many artifacts, such as the Si escape peak, absorption edges, and coincidence peaks, can be traced to the detector. Others, such as secondary fluorescence peaks and scatter peaks, can be traced to the sample. We have identified a new sample-dependent artifact that we attribute to Compton scattering of energetic X-rays generated in a small feature and subsequently scattered from a low atomic number matrix. It seems likely that this artifact has not previously been reported because it only occurs under specific conditions and represents a relatively small signal. However, with the advent of silicon drift detectors and their utility for trace element analysis, we anticipate that more people will observe it and possibly misidentify it. Though small, the artifact is not inconsequential. Under some conditions, it is possible to mistakenly identify the Compton scatter artifact as approximately 1% of an element that is not present.

Copyright
Corresponding author
Corresponding author. E-mail: nicholas.ritchie@nist.gov
Linked references
Hide All

This list contains references from the content that can be linked to their source. For a full set of references and notes please see the PDF or HTML where available.

J. Goldstein , D. Newbury , D. Joy , C. Lyman , P. Echlin , E. Lifshin , L. Sawyer & J. Michael (2003). Scanning Electron Microscopy and X-Ray Microanalysis. New York: Kluwer Academic/Plenum Publishers.

Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Keywords:

Metrics

Full text views

Total number of HTML views: 2
Total number of PDF views: 8 *
Loading metrics...

Abstract views

Total abstract views: 52 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 24th September 2017. This data will be updated every 24 hours.