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Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy

  • Yen Huang (a1) (a2), Tzu-Hung Chuang (a2), Chun-I Lu (a2), Chih-Heng Huang (a3), Deng-Sung Lin (a1) (a4), Chien-Chen Kuo (a3) and Der-Hsin Wei (a1) (a2) (a3)...
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Abstract
Copyright
Corresponding author
* Corresponding author, dhw@nsrrc.org.tw
References
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[1] Feng, J., etal, J. Phys.: Condensed Matter 17 2005 S1339.
[2] Th., Schmidt, et al, Ultramicroscopy 126 2013 23.
[3] Seah, M. P. Dench, W. A. Surf. Interface Anal. 1 1979 2.
[4] Patt, M., et al, Rev. Sci. Instrum. 85 2014 113704.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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