Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-19T16:48:02.690Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of Laboratory Grating-based X-ray Phase Contrast Microtomography for Improved Pathology

Published online by Cambridge University Press:  10 August 2018

Joan Vila-Comamala ,
Carolina Arboleda ,
Lucia Romano ,
Willy Kuo ,
Kristina Lang ,
Konstantins Jefimovs ,
Zhentian Wang ,
Gad Singer ,
David Vine  and
Wenbing Yun
...Show all authors
Joan Vila-Comamala*
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Carolina Arboleda
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Lucia Romano
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland. Department of Physics and CNR-IMM, University of Catania, Catania, Italy
Willy Kuo
Affiliation:
University of Zurich, Zurich, Switzerland.
Kristina Lang
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland. Department of Diagnostic Radiology, Lund University, Lund, Sweden
Konstantins Jefimovs
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Zhentian Wang
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
Gad Singer
Affiliation:
Kantonsspital Baden, Baden, Switzerland
David Vine
Affiliation:
SIGRAY Inc, Concord, California, USA
Wenbing Yun
Affiliation:
SIGRAY Inc, Concord, California, USA
Marco Stampanoni
Affiliation:
Institute for Biomedical Engineering, University and ETH Zurich, Zurich, Switzerland. Paul Scherrer Institut, Villigen PSI, Switzerland.
*
*Corresponding author, joan.vila-comamala@psi.ch

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 190 - 191
Copyright
© Microscopy Society of America 2018 

References

[1] Momose, A., et al, Jpn. J. Appl 42 2003 L866–L868.Google Scholar
[2] Weitkamp, T., et al, Opt. Express 13 2005 2062–2068.CrossRefGoogle Scholar
[3] Pfeiffer, F., et al, Nat. Mat 7 2008 134–137.Google Scholar
[4] www.sigray.com.Google Scholar
[5] Vila-Comamala, , et al, Microelectron. Eng. 192 2018 19–24.Google Scholar
[6] The authors would like to thank the technical assistance of Gordan Mikuljan (PSI) and SIGRAY, Inc. during the setup assembly. This work has been partially funded by the ERC-2012-SRG 310005-PhaseX grant and by the Swiss National Science Foundation, SNSF grant number 159263.Google Scholar