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Direct Imaging of Low-Dimensional Nanostructures

Published online by Cambridge University Press:  01 August 2018

Andrew R. Lupini ,
Bethany M. Hudak ,
Jiaming Song ,
Hunter Sims ,
Yogesh Sharma ,
T. Zac Ward ,
Sokrates T. Pantelides  and
Paul C. Snijders
Andrew R. Lupini
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Bethany M. Hudak
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Jiaming Song
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Hunter Sims
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, Tennessee 37235, USA
Yogesh Sharma
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
T. Zac Ward
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sokrates T. Pantelides
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA Department of Physics and Astronomy and Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, Tennessee 37235, USA
Paul C. Snijders
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 90 - 91
Copyright
© Microscopy Society of America 2018 

References

References:

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[7] This research is sponsored by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U. S. Department of Energy. Additional electron microscopy (ARL) and C-AFM measurements (YS, TZW) were supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. C-AFM measurements were performed at the Center for Nanophase Materials Sciences, a DOE Office of Science User Facility. DFT calculations (HS, STP) were supported by Department of Energy grant DE-FG02-09ER46554 and were performed at the ERDC DSRC with support from subproject AFSNW32473012.Google Scholar