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Article

Direct Imaging of Point Defect Configurations for Au inside Si Nanowires

  • K van Benthem (a1), S-H Oh (a1), AY Borisevich (a1), W Luo (a2), P Werner (a3), ND Zakharov (a3), ST Pantelides (a1) and SJ Pennycook (a1)...
Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Copyright
© 2008 Microscopy Society of America
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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