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Direct Observation of Redox Switching in Resistive Memory Devices Operated In-situ in a Transmission Electron Microscope by Electron Energy Loss Spectroscopy and Off-Axis Electron Holography

Published online by Cambridge University Press:  21 December 2016

David Cooper ,
Nicolas Bernier ,
Christoph Baumer ,
Rafal Dunin-Borkowski  and
Regina Dittmann
David Cooper
Affiliation:
Univ. Grenoble Alpes, F-38000 Grenoble, France CEA, LETI, Minatec Campus, F-38054 Grenoble, France
Nicolas Bernier
Affiliation:
Univ. Grenoble Alpes, F-38000 Grenoble, France CEA, LETI, Minatec Campus, F-38054 Grenoble, France
Christoph Baumer
Affiliation:
Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany
Rafal Dunin-Borkowski
Affiliation:
Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany
Regina Dittmann
Affiliation:
Peter Grunberg Institute, FZ Julich, D-52425 Julich, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S5: Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , November 2016 , pp. 52 - 53
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Waser, R & Aono, M. Nature Materials 6 (2007). p. 833.Google Scholar
[2] Muller, D A, et al, Nature 430 (2004). p. 657 .CrossRefGoogle Scholar
[3] Marchewka, A., et al, Sci Reports 4 2014 6975.Google Scholar
[4] We acknowledge the European Research Council for funding the Starting Grant “Holoview”.Google Scholar