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Sample Preparation of Fully Packaged Quantum Well Laser Diodes for STEM-EBIC Analysis

  • R. Garcia (a1), K.L. Bunker (a1), T.J. Kennedy (a1) and P.E. Russell (a1)

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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