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Simulation of Atomic Resolution Images in STEM

  • LJ Allen (a1), AJ D'Alfonso (a1), M Bosman (a2), SD Findlay (a3), MP Oxley (a4), VJ Keast (a5), JM LeBeau (a6) and S Stemmer (a6)...
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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