Skip to main content
×
Home
    • Aa
    • Aa

Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM

  • Martin Oral (a1), Vilém Neděla (a1) and Gerasimos D. Danilatos (a2)
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM
      Available formats
      ×
      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about sending content to Dropbox.

      Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM
      Available formats
      ×
      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about sending content to Google Drive.

      Dynamic Correction of Higher-Order Deflection Aberrations in the Environmental SEM
      Available formats
      ×
Abstract
Copyright
References
Hide All
[1]Hawkes PW & Kasper E in Principles of Electron Optics. Academic Press), (1994.
[2]Goto E & Soma T, Optik 48 (1977). p. 255.
[3]Lencovä B, Optik 58 (1981). p. 25.
[4]Danilatos G D, US patent No. 6809322 B2 (2004). also known as US 20030168595 A1.
[5]Danilatos GD, Rattenberger J & Dracopoulos V, J. Microsc. 242 (2011). p. 166.
[6]Zhu X, Liu H & Munro E, Proc. SPIE 2522 (1995). p. 66.
[7]Zhu X, et al, Proc. SPIE 3155 (1997). p. 47.
[8]Munro E, Optik 39 (1974). p. 450.
[9]Wang LP, et al, Optik 113 (2002). p. 181.
[10]Kangyan H & Tang TT, Optik 110 (1999). p. 9.
[11]Oral M & Lencovä B, Ultramicroscopy 109 (2009). p. 1365, ..
[12]Lencovä B & Zlämal J, Phys. Procedia 1 (2008). p. 315.
[13] Supported by the Grant Agency of the Czech Republic, Project No. GA14-22777S and by Ministry of Education, Youth and Sports of the Czech Republic (LO1212)..
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 13 *
Loading metrics...

Abstract views

Total abstract views: 50 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 19th October 2017. This data will be updated every 24 hours.