Skip to main content

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
Cancel
×
×
Home
  • Home
Article
  • Cited by 43
  • Cited by
    Crossref Citations
    Crossref logo
    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.
    Polonsky, Andrew T. Echlin, McLean P. Lenthe, William C. Dehoff, Ryan R. Kirka, Michael M. and Pollock, Tresa M. 2018. Defects and 3D structural inhomogeneity in electron beam additively manufactured Inconel 718. Materials Characterization,
    Ram, Farangis and De Graef, Marc 2018. Phase differentiation by electron backscatter diffraction using the dictionary indexing approach. Acta Materialia, Vol. 144, Issue. , p. 352.
    Friedrich, T. Bochmann, A. Dinger, J. and Teichert, S. 2018. Application of the pattern matching approach for EBSD calibration and orientation mapping, utilising dynamical EBSP simulations. Ultramicroscopy, Vol. 184, Issue. , p. 44.
    Rampton, Travis M. Wright, Stuart I. Miles, Michael P. Homer, Eric R. Wagoner, Robert H. and Fullwood, David T. 2018. Improved twin detection via tracking of individual Kikuchi band intensity of EBSD patterns. Ultramicroscopy, Vol. 185, Issue. , p. 5.
    Vermeij, T. and Hoefnagels, J.P.M. 2018. A consistent full-field integrated DIC framework for HR-EBSD. Ultramicroscopy,
    Ram, Farangis and De Graef, Marc 2018. Energy dependence of the spatial distribution of inelastically scattered electrons in backscatter electron diffraction. Physical Review B, Vol. 97, Issue. 13,
    Pascal, Elena Singh, Saransh Callahan, Patrick G. Hourahine, Ben Trager-Cowan, Carol and Graef, Marc De 2018. Energy-weighted dynamical scattering simulations of electron diffraction modalities in the scanning electron microscope. Ultramicroscopy, Vol. 187, Issue. , p. 98.
    Callahan, Patrick G. Echlin, McLean P. Pollock, Tresa M. and De Graef, Marc 2017. Reconstruction of Laser-Induced Surface Topography from Electron Backscatter Diffraction Patterns. Microscopy and Microanalysis, Vol. 23, Issue. 04, p. 730.
    Pascal, Elena Singh, Saransh Ben Hourahine Trager-Cowan, Carol and De Graef, Marc 2017. Dynamical Simulations of Transmission Kikuchi Diffraction (TKD) Patterns. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 540.
    Tessmer, Joseph Singh, Saransh Picard, Yoosuf N. and DeGraef, Marc 2017. Automated Acquisition and Analysis of Selected Area Electron Channeling Patterns in an FEG-SEM. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 550.
    Burch, Matthew J. Fancher, Chris M. Patala, Srikanth De Graef, Marc and Dickey, Elizabeth C. 2017. Mapping 180° polar domains using electron backscatter diffraction and dynamical scattering simulations. Ultramicroscopy, Vol. 173, Issue. , p. 47.
    Lafond, C. Douillard, T. Cazottes, S. Dubail, S. and Langlois, C. 2017. Crystallographic Orientation Maps Obtained from Ion and Backscattered Electron Channeling Contrast. Microscopy and Microanalysis, Vol. 23, Issue. S1, p. 552.
    Wittkamper, Julia Xu, Zhongnan Kombaiah, Boopathy Ram, Farangis De Graef, Marc Kitchin, John R. Rohrer, Gregory S. and Salvador, Paul A. 2017. Competitive Growth of Scrutinyite (α-PbO2) and Rutile Polymorphs of SnO2 on All Orientations of Columbite CoNb2O6 Substrates. Crystal Growth & Design, Vol. 17, Issue. 7, p. 3929.
    Nolze, Gert Hielscher, Ralf and Winkelmann, Aimo 2017. Electron backscatter diffraction beyond the mainstream. Crystal Research and Technology, Vol. 52, Issue. 1, p. 1600252.
    Hansen, Landon T. Jackson, Brian E. Fullwood, David T. Wright, Stuart I. De Graef, Marc Homer, Eric R. and Wagoner, Robert H. 2017. Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs). Microscopy and Microanalysis, Vol. 23, Issue. 03, p. 460.
    Brodu, E. Bouzy, E. and Fundenberger, J.-J. 2017. Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEM. Ultramicroscopy, Vol. 181, Issue. , p. 123.
    Naresh-Kumar, G. Vilalta-Clemente, A. Jussila, H. Winkelmann, A. Nolze, G. Vespucci, S. Nagarajan, S. Wilkinson, A. J. and Trager-Cowan, C. 2017. Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction. Scientific Reports, Vol. 7, Issue. 1,
    Singh, Saransh Ram, Farangis and De Graef, Marc 2017. Application of forward models to crystal orientation refinement. Journal of Applied Crystallography, Vol. 50, Issue. 6, p. 1664.
    Ram, Farangis Wright, Stuart Singh, Saransh and De Graef, Marc 2017. Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing. Ultramicroscopy, Vol. 181, Issue. , p. 17.
    Singh, Saransh and De Graef, Marc 2017. Dictionary Indexing of Electron Channeling Patterns. Microscopy and Microanalysis, Vol. 23, Issue. 01, p. 1.
    Download full list
    ×
  • Get access
    Add to cart USD35.00
    Check if you have access via personal or institutional login
    Log in Register Recommend to librarian

Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations

  • Patrick G. Callahan (a1) and Marc De Graef (a1)
Abstract

A new approach for the simulation of dynamic electron backscatter diffraction (EBSD) patterns is introduced. The computational approach merges deterministic dynamic electron-scattering computations based on Bloch waves with a stochastic Monte Carlo (MC) simulation of the energy, depth, and directional distributions of the backscattered electrons (BSEs). An efficient numerical scheme is introduced, based on a modified Lambert projection, for the computation of the scintillator electron count as a function of the position and orientation of the EBSD detector; the approach allows for the rapid computation of an individual EBSD pattern by bi-linear interpolation of a master EBSD pattern. The master pattern stores the BSE yield as a function of the electron exit direction and exit energy and is used along with weight factors extracted from the MC simulation to obtain energy-weighted simulated EBSD patterns. Example simulations for nickel yield realistic patterns and energy-dependent trends in pattern blurring versus filter window energies are in agreement with experimental energy-filtered EBSD observations reported in the literature.

Copyright
COPYRIGHT: © Microscopy Society of America 2013 
Corresponding author
* Corresponding author. E-mail: degraef@cmu.edu
References
Hide All
Bloch, F. (1929). Bemerkung zur Elektronentheorie des Ferromagnetismus und der elektrischen Leitfähigkeit. Z Phys 57, 545–555.
Bunge, H.-J. (1982). Texture Analysis in Materials Science: Mathematical Methods. London: Butterworths.
Deal, A., Hooghan, T. & Eades, A. (2008). Energy-filtered electron backscatter diffraction. Ultramicroscopy 108, 116–125.
Engler, O. & Randle, V. (2010). Introduction to Texture Analysis, 2nd ed. Boca Raton, FL: CRC Press.
Heinrich, K.H.J., Newbury, D.E. & Yakowitz, H. (Eds.) (1975). Use of Monte Carlo Calculations in Electron Probe Microanalysis and Scanning Electron Microscopy. Gaithersburg, MD: National Bureau of Standards.
Howie, A. & Whelan, M.J. (1961). Diffraction contrast of electron microscope images of crystal lattice defects. II. The development of a dynamical theory. Proc R Soc Lond A 263, 217–237.
Humphreys, C.J. (1979). The scattering of fast electrons by crystals. Rep Prog Phys 42, 1825–1887.
Joy, D.C. (1995). Monte Carlo Modeling for Electron Microscopy and Microanalysis. New York: Oxford University Press.
Krishnan, K.M. (1988). Atomic site and species determinations using channeling and related effects in analytical electron microscopy. Ultramicroscopy 24, 125–142.
Morawiec, A. (1999). Automatic orientation determination from Kikuchi patterns. J Appl Cryst 32, 788–798.
Morawiec, A. (2004). Orientations and Rotations: Computations in Crystallographic Textures. New York: Springer Verlag.
Reimer, L. (1985). Scanning Electron Microscopy: Physics of Image Formation and Microanalysis. Springer Series in Optical Sciences, vol. 45. Berlin: Springer-Verlag.
Roşca, D. (2010). New uniform grids on the sphere. Astron Astrophys A63, 520–525.
Rossouw, C.J., Miller, P.R., Josefsson, T.W. & Allen, L.J. (1994). Zone axis back-scattered electron contrast for fast electrons. Phil Mag A 70, 985–998.
Schwartz, A.J., Kumar, M., Adams, B.L. & Field, D.P. (Eds.) (2009). Electron Backscatter Diffraction in Materials Science, 2nd ed. New York: Springer.
Stary, V. (2011). Monte Carlo simulation in electron microscopy and spectroscopy. In Applications of Monte Carlo Method in Science and Engineering, chapter 10, Mordechai, S. (Ed.), pp. 195–230. Rijeka, Croatia: InTech.
Wang, Z.L. (1995). Elastic and Inelastic Scattering in Electron Diffraction and Imaging. New York: Plenum Press.
Weickenmeier, A. & Kohl, H. (1991). Computation of absorptive form factors for high-energy electron diffraction. Acta Crystall A 47, 590–597.
Winkelmann, A., Trager-Cowan, C., Sweeney, F., Day, A.P. & Parbrook, P. (2007). Many-beam dynamical simulation of electron backscatter diffraction patterns. Ultramicroscopy 107, 414–421.
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *

CAPTCHA *

Skip to the audio challenge
×

Keywords:

Metrics

Full text views

Total number of HTML views: 3
Total number of PDF views: 96 *
Loading metrics...

Abstract views

Total abstract views: 389 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 13th June 2018. This data will be updated every 24 hours.

Cancel
Confirm
×