Skip to main content
    • Aa
    • Aa

Early Results from an Aberration-Corrected JEOL 2200FS STEM/TEM at Oak Ridge National Laboratory

  • Douglas A. Blom (a1), Lawrence F. Allard (a1), Satoshi Mishina (a2) and Michael A. O'Keefe (a3)

The resolution-limiting aberrations of round electromagnetic lenses can now be successfully overcome via the use of multipole element “aberration correctors.” The installation and performance of a hexapole-based corrector (CEOS GmbH) integrated on the probe-forming side of a JEOL 2200FS FEG STEM/TEM is described. For the resolution of the microscope not to be severely compromised by its environment, a new, specially designed building at Oak Ridge National Laboratory has been built. The Advanced Microscopy Laboratory was designed with the goal of providing a suitable location for aberration-corrected electron microscopes. Construction methods and performance of the building are discussed in the context of the performance of the microscope. Initial performance of the microscope on relevant specimens and modifications made to eliminate resolution-limiting conditions are also discussed.

Corresponding author
Corresponding author. E-mail:
Hide All
Batson, P.E. (2003). Aberration correction results in the IBM STEM instrument. Ultramicroscopy96, 239249.

Batson, P.E., Dellby, N., & Krivanek, O.L. (2002). Sub-Ångstrom resolution using aberration corrected electron optics. Nature418, 617620.

Fung, A.S., Tooley, P.A., Kelley, M.J., Koningsberger, D.C., & Gates, B.C. (1991). Cationic trirhenium rafts on γ-Al2O3: Characterization by X-ray absorption spectroscopy. J Phys Chem95, 225234.

Haider, M., Uhlemann, S., & Zach, J. (2000). Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM. Ultramicroscopy81, 163175.

Huggins, D.K., Fellmann, W., Smith, J.M., & Kaesz, H.D. (1964). A polynuclear tetracarbonyl hydride of rhenium. Preparation and properties. J Am Chem Soc86, 48414846.

Lin, J.A. & Cowley, J.M. (1986). Calibration of the operating parameters for an HB5 STEM instrument. Ultramicroscopy19, 3142.

Liu, J. (2004). Advanced electron microscopy characterization of nanostructured heterogeneous catalysts. Microsc Microanal10, 551576.

O'Keefe, M.A., Allard, L.F., & Blom, D.A. (2005a). HRTEM imaging of atoms at sub-Ångstrom resolution. J Electron Microsc54, 169.

O'Keefe, M.A., Allard, L.F., & Blom, D.A. (2005b). Resolution quality and atom positions in sub-Ångstrom electron microscopy. Microsc Microanal 11, 540CD.

Sohlberg, K., Rashkeev, S., Borisevich, A.Y., Pennycook, S.J., & Pantelides, S.T. (2004). Origin of anomalous Pt-Pt distances in the Pt/alumina catalytic system. ChemPhysChem5, 18931897.

van Benthem, K., Lupini, A.R., Kim, M., Baik, H.S., Doh, S., Lee, J.-H., Oxley, M.P., Findlay, S.D., Allen, L.J., Luck, J., & Pennycook, S.J. (2005). Three-dimensional imaging of individual hafnium atoms inside a semiconductor device. Appl Phys Lett87, 034104.

Wang, S., Borisevich, A.Y., Rashkeev, S.N., Glazoff, M.V., Sohlberg, K., Pennycook, S.J., & Pantelides, S.T. (2004). Dopants adsorbed as single atoms prevent degradation of catalysts. Nat Mater3, 143146.

Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *



Full text views

Total number of HTML views: 8
Total number of PDF views: 9 *
Loading metrics...

Abstract views

Total abstract views: 98 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 17th October 2017. This data will be updated every 24 hours.