Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

X Llovet; C Merlet

doi:10.1017/S1431927609094215

Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

Published online by Cambridge University Press: 26 July 2009

X Llovet and

C Merlet

Show author details

X Llovet: Affiliation:
University of Barcelona,Spain
C Merlet: Affiliation:
University of Montpellier II,France

Article contents

Extract

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type: Abstract
Information: Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 516 - 517

DOI: https://doi.org/10.1017/S1431927609094215 [Opens in a new window]

Article contents

Electron Probe Microanalysis of Thin Films and Multilayers Using the X-FILM Computer Code

Extract

Save article to Kindle

Save article to Dropbox

Save article to Google Drive

Reply to: Submit a response

Your details

You have entered the maximum number of contributors

Conflicting interests