Hostname: page-component-8448b6f56d-c4f8m Total loading time: 0 Render date: 2024-04-25T01:59:32.041Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Published online by Cambridge University Press:  05 August 2019

Toma Susi ,
Mukesh Tripathi ,
Kimmo Mustonen ,
Alexander Markevich ,
Clemens Mangler ,
Cong Su ,
Ju Li ,
Juan Carlos Idrobo ,
Jannik Meyer  and
Jani Kotakoski
Toma Susi*
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Mukesh Tripathi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Alexander Markevich
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Clemens Mangler
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Cong Su
Affiliation:
Massachusetts Institute of Technology, Department of Nuclear Science and Engineering and Department of Materials Science and Engineering, Cambridge, USA. Massachusetts Institutes of Technology, Research Lab of Electronics, Cambridge, USA.
Ju Li
Affiliation:
Massachusetts Institute of Technology, Department of Nuclear Science and Engineering and Department of Materials Science and Engineering, Cambridge, USA.
Juan Carlos Idrobo
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, USA.
Jannik Meyer
Affiliation:
University of Tübingen, Institute of Applied Physics, Tübingen, Germany.
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
*
*Corresponding author: toma.susi@univie.ac.at

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 938 - 939
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Susi, T et al. , 2D Materials 4 (2017), p. 021013.Google Scholar
[2]Susi, T et al. , Physical Review Letters 113 (2014), p. 115501.Google Scholar
[3]Susi, T et al. , Ultramicroscopy 180 (2017), p. 163.Google Scholar
[4]Dyck, O et al. , Applied Physics Letters 111 (2017), p. 113104.Google Scholar
[5]Tripathi, M et al. , Nano Letters 18 (2018), p. 5319.Google Scholar
[6]Mustonen, K et al. , arXiv:1902.03972 (2019).Google Scholar
[7]Su, C et al. , arXiv:1803.01369 (2019).Google Scholar
[8]Tripathi, M et al. , ACS Nano 12 (2018), p. 4641.Google Scholar
[9]Susi, T et al. , 2D Materials 4 (2017), p. 042004.Google Scholar
[10]The work was funded by the European Research Council (ERC) Grant No. 756277-ATMEN.Google Scholar