Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Home
  • Home
EnglishFrançais
Microscopy and Microanalysis Microscopy and Microanalysis

Article contents

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes

Published online by Cambridge University Press:  05 August 2019

Toma Susi ,
Mukesh Tripathi ,
Kimmo Mustonen ,
Alexander Markevich ,
Clemens Mangler ,
Cong Su ,
Ju Li ,
Juan Carlos Idrobo ,
Jannik Meyer  and
Jani Kotakoski
Toma Susi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Mukesh Tripathi
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Kimmo Mustonen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Alexander Markevich
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Clemens Mangler
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Cong Su
Affiliation:
Massachusetts Institute of Technology, Department of Nuclear Science and Engineering and Department of Materials Science and Engineering, Cambridge, USA. Massachusetts Institutes of Technology, Research Lab of Electronics, Cambridge, USA.
Ju Li
Affiliation:
Massachusetts Institute of Technology, Department of Nuclear Science and Engineering and Department of Materials Science and Engineering, Cambridge, USA.
Juan Carlos Idrobo
Affiliation:
Oak Ridge National Laboratory, Center for Nanophase Materials Sciences, Oak Ridge, USA.
Jannik Meyer
Affiliation:
University of Tübingen, Institute of Applied Physics, Tübingen, Germany.
Jani Kotakoski
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria.
Corresponding
E-mail address:
toma.susi@univie.ac.at
Save pdf (0.5 mb)
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this article
An abstract is not available for this content so a preview has been provided. To view the full text please use the links above to select your preferred format.
Type
Current and Emerging Microscopy for Quantum Information Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 938 - 939
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Susi, T et al. , 2D Materials 4 (2017), p. 021013.CrossRefGoogle Scholar
[2]Susi, T et al. , Physical Review Letters 113 (2014), p. 115501.CrossRefGoogle Scholar
[3]Susi, T et al. , Ultramicroscopy 180 (2017), p. 163.CrossRefGoogle Scholar
[4]Dyck, O et al. , Applied Physics Letters 111 (2017), p. 113104.CrossRefGoogle Scholar
[5]Tripathi, M et al. , Nano Letters 18 (2018), p. 5319.CrossRefGoogle Scholar
[6]Mustonen, K et al. , arXiv:1902.03972 (2019).Google Scholar
[7]Su, C et al. , arXiv:1803.01369 (2019).Google Scholar
[8]Tripathi, M et al. , ACS Nano 12 (2018), p. 4641.CrossRefGoogle Scholar
[9]Susi, T et al. , 2D Materials 4 (2017), p. 042004.CrossRefGoogle Scholar
[10]The work was funded by the European Research Council (ERC) Grant No. 756277-ATMEN.Google Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 112 *
View data table for this chart

* Views captured on Cambridge Core between 05th August 2019 - 15th January 2021. This data will be updated every 24 hours.

Access
Hostname: page-component-77fc7d77f9-kstv4 Total loading time: 0.425 Render date: 2021-01-15T18:56:44.518Z Query parameters: { "hasAccess": "1", "openAccess": "0", "isLogged": "0", "lang": "en" } Feature Flags last update: Fri Jan 15 2021 18:00:25 GMT+0000 (Coordinated Universal Time) Feature Flags: { "metrics": true, "metricsAbstractViews": false, "peerReview": true, "crossMark": true, "comments": true, "relatedCommentaries": true, "subject": true, "clr": true, "languageSwitch": true, "figures": false, "newCiteModal": false, "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true }

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Electron-Beam Manipulation of Lattice Impurities in Graphene and Single-Walled Carbon Nanotubes
Available formats
×
×

Reply to: Submit a response

Your details

Conflicting interests

Do you have any conflicting interests? *