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Environmental Transmission Electron Microscopy in an Aberration-Corrected Environment

  • Thomas W. Hansen (a1) and Jakob B. Wagner (a1)
  • DOI: http://dx.doi.org/10.1017/S1431927612000293
  • Published online: 12 June 2012
Abstract
Abstract

The increasing use of environmental transmission electron microscopy (ETEM) in materials science provides exciting new possibilities for investigating chemical reactions and understanding both the interaction of fast electrons with gas molecules and the effect of the presence of gas on high-resolution imaging. A gaseous atmosphere in the pole-piece gap of the objective lens of the microscope alters both the incoming electron wave prior to interaction with the sample and the outgoing wave below the sample. Whereas conventional TEM samples are usually thin (below 100 nm), the gas in the environmental cell fills the entire gap between the pole pieces and is thus not spatially localized. By using an FEI Titan environmental transmission electron microscope equipped with a monochromator and an aberration corrector on the objective lens, we have investigated the effects on imaging and spectroscopy caused by the presence of the gas.

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Corresponding author. E-mail: twh@cen.dtu.dk
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