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Fine structures of Fe L-emission examined by a new HR-SXES instrument

Published online by Cambridge University Press:  30 July 2021

Masami Terauchi ,
Ryogo Ebisu ,
Yohei Sato  and
Masato Koike
Masami Terauchi
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan
Ryogo Ebisu
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan
Yohei Sato
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Miyagi, Japan
Masato Koike
Affiliation:
KPSI, QuBS, QST, Kizugawa, Kyoto, Japan

Abstract

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Type
Unresolved Challenges in Quantitative X-ray Microanalysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1370 - 1371
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Terauchi, M., Chap. 7 in “Transmission Electron Microscopy Characterization of Nanomaterials” (ed. Kumar C, S S R, Springer-Verlag Berlin Heidelberg, 2014)Google Scholar
Terauchi, M., Microscopy 68, 330-337 (2019).CrossRefGoogle Scholar
Terauchi, M., et al. , IOP Conf. Series: Materials Science and Engineering 304, 012018 (2017).CrossRefGoogle Scholar
Terauchi, M., et al. , J. of Electron Microscopy 59, 251-261 (2010).CrossRefGoogle ScholarPubMed
Terauchi, M. et al. , IOP Conf. Series: Materials Science and Engineering 891, 012022 (2020).CrossRefGoogle Scholar
Peng, G., et al. , J. Am. Chem. Soc. 116, 2914-2920 (1994).CrossRefGoogle Scholar
This work was partly supported by the Research Program of "Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials" in "Network Joint Research Centre for Materials and Devices"Google Scholar