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Fully Automatic Registration of Electron Microscopy Images with High and Low Resolution

  • V Kaynig (a1), B Fischer (a1), R Wepf (a1) and JM Buhmann (a1)

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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