Skip to main content
×
×
Home

Hard X-ray In-situ Full-field Microscopy for Material Science Applications.

  • Irina Snigireva (a1), Ken Vidar Falch (a2), Daniele Casari (a2), Marco Di Michiel (a1), Carsten Detlefs (a1), Ragnvald Mathiesen (a2) and Anatoly Snigirev (a3)...
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Hard X-ray In-situ Full-field Microscopy for Material Science Applications.
      Available formats
      ×
      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      Hard X-ray In-situ Full-field Microscopy for Material Science Applications.
      Available formats
      ×
      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      Hard X-ray In-situ Full-field Microscopy for Material Science Applications.
      Available formats
      ×
Abstract
Copyright
Corresponding author
* Corresponding author, email: irina@esrf.fr
References
Hide All
[1] Snigirev, A., Kohn, V., Snigireva, I. Lengeler, B. Nature 384 1996 4951.
[2] Kohn, V., Snigireva, I. Snigirev, A. Opt. Comm. 216 2003 247260.
[3] Bosak, A., Snigireva, I., Napolskii, K. Snigirev, A. Adv. Mater. 22 2010 32563259.
[4] Byelov, D., et al, RSC Advances 3 2013 15670.
[5] Falch, K. V., et al, J. Mater Sci. 52 2017 34973507.
[6] Falch, K. V., et al, Appl. Phys. Lett. 109 2016 054103.
[7] Falch, K. V., et al, Ultramicroscopy 184 2018 267273.
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed