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Microscopy and Microanalysis Microscopy and Microanalysis

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Harvesting Microscopy Experimental Context with a Configurable Laboratory Information Management System

Published online by Cambridge University Press:  05 August 2019

Joshua A. Taillon ,
Rachel F. Devers ,
Raymond L. Plante ,
Marcus W. Newrock ,
June W. Lau  and
Gretchen Greene
Joshua A. Taillon
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MDUSA
Rachel F. Devers
Affiliation:
Department of Electrical and Computer Engineering, University of Maryland, College Park, MDUSA
Raymond L. Plante
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MDUSA
Marcus W. Newrock
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MDUSA
June W. Lau
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MDUSA
Gretchen Greene
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg MDUSA
Corresponding
E-mail address:
joshua.taillon@nist.gov
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Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 140 - 141
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Wilkinson, MD et al. , Scientific Data 3 (2016), p. 160018.CrossRefGoogle ScholarPubMed
[2]Devers, RF et al. , Microscopy and Microanalysis 24 (2018), p. 564.CrossRefGoogle Scholar
[3]2017 17th IEEE/ACM Int. Symp. Clust. Cloud Grid Comput. (2017) p. 11.Google Scholar
[4]Dima, A et al. , JOM 68 (2016), p. 2053.CrossRefGoogle Scholar

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