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High Performance Computing Tools for Cross Correlation of Multi-Dimensional Data Sets Across Instrument Platforms

Published online by Cambridge University Press:  25 July 2016

Alex Belianinov ,
Danka Gobeljic ,
Vladimir Shvartsman ,
Erik Endeve ,
Eric J. Lingerfelt ,
Richard Archibald ,
Sergei Kalinin  and
Stephen Jesse
Alex Belianinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Danka Gobeljic
Affiliation:
Institute for Material Science and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Essen, Germany
Vladimir Shvartsman
Affiliation:
Institute for Material Science and Center for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen, Essen, Germany
Erik Endeve
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Eric J. Lingerfelt
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Richard Archibald
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Sergei Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN, USA The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 288 - 289
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Ovchinnikova, O S, et al, ACS Nano 9(4 (2015). p. 4260.Google Scholar
[2] Belianinov, A, et al, APL Materials 2(12 (2014). p. 120701.Google Scholar
[3] Gobeljic, D, et al, Nanoscale 8(4 (2016). p. 2168.Google Scholar
[4] Research for all authors was supported by the US Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division. This research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U. S. Department of Energy.Google Scholar