Hostname: page-component-8448b6f56d-m8qmq Total loading time: 0 Render date: 2024-04-18T18:01:30.516Z Has data issue: false hasContentIssue false

High-resolution 3D scanning X-ray microscopes at the Swiss Light Source

Published online by Cambridge University Press:  10 August 2018

Mirko Holler*
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Jorg Raabe
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Ana Diaz
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Manuel Guizar-Sicairos
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Esther H. R. Tsai
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Michal Odstrcil
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Andreaes Menzel
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland
Oliver Bunk
Affiliation:
Paul Scherrer Institut, 5232 Villigen PSI, Switzerland

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Holler, M, Raabe, J, Diaz, A, Guizar-Sicairos, M, Wepf, R, Odstrcil, M, et al. OMNY - a tOMography Nano crYo stage. Rev Sci Instrum 2018.CrossRefGoogle ScholarPubMed
[2] Holler, M Raabe, J. Tracking type laser interferometer for objects with rotational degrees of freedom. Patent application WO 2012079875, A1 2010.Google Scholar
[3] Holler, M Raabe, J. Error motion compensating tracking interferometer for the position measurement of objects with rotational degree of freedom. Optical Engineering 54(no. 5 2015 05410.CrossRefGoogle Scholar
[4] Holler, M, Raabe, J, Diaz, A, Guizar-Sicairos, M, Quitmann, C, Menzel, A, et al. An instrument for 3D x-ray nano-imaging. Review of Scientific Instruments 2012 83(7), 073703.CrossRefGoogle ScholarPubMed
[5] Holler, M, Raabe, J, Wepf, R, Shahmoradian, SH, Diaz, A, Sarafimov, B, et al. OMNY PIN—A versatile sample holder for tomographic measurements at room and cryogenic temperatures. Review of Scientific Instruments 2017 88(11), 113701.CrossRefGoogle ScholarPubMed
[6] Holler, M, Guizar-Sicairos, M, Tsai, EHR, Dinapoli, R, Muller, E, Bunk, O, et al High-resolution non-destructive three-dimensional imaging of integrated circuits. Nature 2017 543(7645), 402.CrossRefGoogle ScholarPubMed
[7] De Angelis, S, Jrgensen, PS, Esposito, V, Tsai, EHR, Holler, M, Kreka, K, et al Ex-situ tracking solid oxide cell electrode microstructural evolution in a redox cycle by high resolution ptychographic nanotomography. Journal of Power Sources 2017 360, 520527.CrossRefGoogle Scholar
[8] Donnelly, C, Guizar-Sicairos, M, Scagnoli, V, Gliga, S, Holler, M, Raabe, J, et al Three-dimensional magnetization structures revealed with X-ray vector nanotomography. Nature 2017 547(7663), 328+.CrossRefGoogle ScholarPubMed
[9] Wilts, BD, Sheng, X, Holler, M, Diaz, A, Guizar-Sicairos, M, Raabe, J, et al Evolutionary-optimized photonic network structure in white beetle wing scales. Advanced Materials 2017) 1702057-n/a..Google ScholarPubMed
[10] Pallon, LKH, Nilsson, F, Yu, S, Liu, DM, Diaz, A, Holler, M, et al Three-Dimensional nanometer features of direct current electrical trees in low-density polyethylene. Nano Lett 2017 17(3), 14021408.CrossRefGoogle ScholarPubMed
[11] Shahmoradian, S, Tsai, E, Diaz, A, Guizar-Sicairos, M, Spcyher, L, Raabe, J, et al. Three- dimensional imaging of biological tissue by Cryo X-Ray ptychography. Sci Rep 7(No. 1 2017 6291.CrossRefGoogle ScholarPubMed