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High-Resolution and High-Throughput Ptychography with Depth Sensitivity Using Multilayer Laue Lenses

  • Xiaojing Huang (a1), Hande Ozturk (a1), Hanfei Yan (a1), Yan He (a1) (a2), Mingyuan Ge (a1), Zhihua Dong (a3), Meifeng Lin (a3), Evgeny Nazaretski (a1), Petr Ilinski (a1), Ian Robinson (a4) (a5) and Yong Chu (a1)...
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Corresponding author
*Corresponding author: xjhuang@bnl.gov
References
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[1] Maiden, A, et al, J. Opt. Soc. Am. A 29 2012 16061614.
[2] Suzuki, A, et al, Phys. Rev. Lett. 112 2014 053903.
[3] Shimomura, K, et al, Phys. Rev. B 91 2015 214114.
[4] Shimomura, K, et al, Acta Crystallogr. A 74 2018 6670.
[5] Tsai, E, et al, Opt. Express 24 2016 2908929108.
[6] Huang, X, et al, Appl. Phys. Lett. 111 2017 023103.
[7] Ozturk, H, et al, Optica 5(5 2018 601607.
[8] The authors acknowledge the Laboratory Directed Research and Development (LDRD-21690) program. This research used resources of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Brookhaven National Laboratory under Contract No. DE-SC0012704.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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