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    This article has been cited by the following publications. This list is generated based on data provided by CrossRef.

    Marsh, K. L. Souliman, M. and Kaner, R. B. 2015. Co-solvent exfoliation and suspension of hexagonal boron nitride. Chem. Commun., Vol. 51, Issue. 1, p. 187.


    Wu, Ryan J. Odlyzko, Michael L. and Mkhoyan, K. Andre 2014. Determining the thickness of atomically thin MoS2 and WS2 in the TEM. Ultramicroscopy, Vol. 147, p. 8.


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Identifying Hexagonal Boron Nitride Monolayers by Transmission Electron Microscopy

  • Michael L. Odlyzko (a1) and K. Andre Mkhoyan (a1)
  • DOI: http://dx.doi.org/10.1017/S143192761200013X
  • Published online: 12 April 2012
Abstract
Abstract

Multislice simulations in the transmission electron microscope (TEM) were used to examine changes in annular-dark-field scanning TEM (ADF-STEM) images, conventional bright-field TEM (BF-CTEM) images, and selected-area electron diffraction (SAED) patterns as atomically thin hexagonal boron nitride (h-BN) samples are tilted up to 500 mrad off of the [0001] zone axis. For monolayer h-BN the contrast of ADF-STEM images and SAED patterns does not change with tilt in this range, while the contrast of BF-CTEM images does change; h-BN multilayer contrast varies strongly with tilt for ADF-STEM imaging, BF-CTEM imaging, and SAED. These results indicate that tilt series analysis in ADF-STEM image mode or SAED mode should permit identification of h-BN monolayers from raw TEM data as well as from quantitative post-processing.

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Corresponding author
Corresponding author. E-mail: mkhoyan@umn.edu
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  • ISSN: 1431-9276
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