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    LIU, SHU-SHENG TAKAYAMA, AKIKO MATSUMURA, SYO and KOYAMA, MICHIHISA 2016. Image contrast enhancement of Ni/YSZ anode during the slice-and-view process in FIB-SEM. Journal of Microscopy, Vol. 261, Issue. 3, p. 326.
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Image Segmentation for Advanced Characterization of 3D FIB-SEM Reconstructions

  • M. Marsh (a1)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Copyright
COPYRIGHT: © Microscopy Society of America 2012
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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