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Imaging Li–Ion Battery Material with Low Voltage Backscattered Electrons – comparison of a Field Emission SEM Crossbeam540/Merlin with the DELTA SEM

Published online by Cambridge University Press:  05 August 2019

U. Golla-Schindler ,
I. Wacker ,
B. Schindler ,
T. Bernthaler ,
G. Schneider  and
R.R. Schröder
U. Golla-Schindler*
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
I. Wacker
Affiliation:
Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany. Cryo Electron Microscopy, BioQuant, University Hospital Heidelberg, Germany.
B. Schindler
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany.
T. Bernthaler
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
G. Schneider
Affiliation:
Materials Research Institute (IMFAA), Aalen University, Aalen, Germany.
R.R. Schröder
Affiliation:
Centre for Advanced Materials (CAM), University Heidelberg, Heidelberg, Germany. Cryo Electron Microscopy, BioQuant, University Hospital Heidelberg, Germany.
*
*ute.golla-schindler@hs-aalen.de

Abstract

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Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 448 - 449
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Schröder, R.R. et al. , Microscopy and Microanalysis 24 (2018) p. 626Google Scholar
[2]Golla-Schindler, U. et al. , Micron 113 (2018) p. 10-19Google Scholar
[3]Böngeler, R. et al. , Scanning 15 (1993) p. 1-18Google Scholar
[4]We thank the Center for Advanced Materials and ZEISS GmbH for the DELTA images.Google Scholar