Hostname: page-component-8448b6f56d-xtgtn Total loading time: 0 Render date: 2024-04-25T03:56:40.672Z Has data issue: false hasContentIssue false

Improved Low Voltage SEM Image Resolution Through the Use of Image Restoration Techniques

Published online by Cambridge University Press:  23 September 2015

Matthew D. Zotta
Affiliation:
College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, NY, USA
Yudhishthir P. Kandel
Affiliation:
College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, NY, USA
Andrew N. Caferra
Affiliation:
College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, NY, USA
Eric Lifshin
Affiliation:
College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, NY, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

1. Michael, J.R, Scanning 33, 147154 (2011).Google Scholar
2. Lifshin, E., Kandel, Y.P. & Moore, R.L, Microscopy and Microanalysis 20(01), 7889 (2014).Google Scholar
3. Lin, Y. & Joy, D. C, Surf. Interface Anal 37, 895900 (2005).Google Scholar
4. Joy, D.C, J Microsc 208(Pt1), 2434 (2002).CrossRefGoogle Scholar