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In situ EC-TEM Studies of Metal Thin Film Corrosion in Liquid Solutions at Elevated Temperatures

Published online by Cambridge University Press:  01 August 2018

Jeung Hun Park
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, United States. Department of Mechanical and Aerospace Engineering, and Andlinger Center for Energy and the Environment, Princeton University, Princeton, New Jersey 08544, United States.
Tommy Watanabe
Affiliation:
Hitachi Metals America, Purchase, New York 10577, United States.
Ainsley Pinkowitz
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, United States.
David J. Duquette
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, United States.
Robert Hull
Affiliation:
Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, New York 12180, United States.
Daniel A. Steingart
Affiliation:
Department of Mechanical and Aerospace Engineering, and Andlinger Center for Energy and the Environment, Princeton University, Princeton, New Jersey 08544, United States.
Frances M. Ross
Affiliation:
IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, United States.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Strehblow, H.-H., et al in Corrosion Mechanisms in Theory and Practice, Third Edition 2012) ed. P. Marcus CRC Press New York.Google Scholar
[2] Ross, F. M. Science 350 2015 aaa9886.Google Scholar
[3] Chee, S. W., et al, Chemical Communications 51 2015 168.Google Scholar
[4] Park, J. H., et al, Nano Letters 15 2015 5314.Google Scholar
[5] Park, J. H., et al, Science Advances 3 2017 e1700234.Google Scholar
[6] We acknowledge financial support from the BP Carbon Mitigation Initiative and from NSF- GOALI (CMMI 1129722, DMR-1310639 and DMR-1309509). We also acknowledge the invaluable technical support of Dr Mark C. Reuter and Mr. Arthur W. Ellis of IBM..Google Scholar