Hostname: page-component-76fb5796d-22dnz Total loading time: 0 Render date: 2024-04-25T22:13:52.448Z Has data issue: false hasContentIssue false
  • English
  • Français

In Situ TEM Characterization of Nanostructured Dielectrics

Published online by Cambridge University Press:  23 September 2015

Ming-Siao Hsiao ,
Yifei Yuan ,
Christopher Grabowski ,
Anmin Nie ,
Reza Shabazian-Yassar  and
Lawrence F. Drummy
Ming-Siao Hsiao
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433 UES, Inc., Dayton, OH 45432
Yifei Yuan
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Christopher Grabowski
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433 UES, Inc., Dayton, OH 45432
Anmin Nie
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Reza Shabazian-Yassar
Affiliation:
Department of Mechanical Engineering, Michigan Technological University, Houghton, MI 49931 Physics Department, University of Illinois at Chicago, Chicago, IL 60607
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratories, WPAFB, OH 45433

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1813 - 1814
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Whittingham, M. S., MRS Bull vol. 33 (2008). p 411.CrossRefGoogle Scholar
[2] Barber, P., Loye, H.-C. Z., et al, Materials vol. 2 (2009). p 1697.Google Scholar
[3] Grabowski, C. A., Vaia, R. A., et al, ACS Appl. Mater. Interfaces vol. 6 ( 2014). p 21500.Google Scholar
[4] Hsiao, M.-S., Drummy, L. F., et al In preparation.Google Scholar
[5] The authors acknowledge support from the Air Force Research Laboratory.Google Scholar