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Industrial Applications of Electron Microscopy: A Shared Laboratory Perspective

Published online by Cambridge University Press:  05 August 2019

Peng Zhang*
Affiliation:
EAG Laboratories, Eurofins Materials Science, 810 Kifer Road, Sunnyvale, CA 94086
Mike Salmon
Affiliation:
EAG Laboratories, Eurofins Materials Science, 628 Hutton St #103, Raleigh, NC 27606
Shaojie Wang
Affiliation:
Nanolab Technologies, Eurofins Materials Science, 1708 McCarthy Blvd, Milpitas, CA 95035
Jingyi Zhang
Affiliation:
EAG Laboratories, Eurofins Materials Science, 810 Kifer Road, Sunnyvale, CA 94086
Mark Izquierdo
Affiliation:
EAG Laboratories, Eurofins Materials Science, 810 Kifer Road, Sunnyvale, CA 94086
Jane Sun
Affiliation:
Nanolab Technologies, Eurofins Materials Science, 1708 McCarthy Blvd, Milpitas, CA 95035
*
*Corresponding author: PengZhang@eurofinsEAG.com
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Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Midgley, PA, Dunin-Borkowski, RE, Nature Materials 8 (2009), p.271.CrossRefGoogle Scholar
[2]Wikipedia, https://en.wikipedia.org/wiki/Blend_modes (accessed February 22th, 2019).Google Scholar
[3]Longo, P, Zhang, H, Twesten, RD, Materials Science in Semiconductor Processing 65 (2017), p.44.CrossRefGoogle Scholar
[4]Picard, YN, et al. , Scripta Materialia 61 (2009), p.773.CrossRefGoogle Scholar
[5]Ponce, FA, et al. , Applied Physics Letters 68 (1996), p.57.CrossRefGoogle Scholar
[6]Schreiber, J, Hildebrandt, S, Materials Science and Engineering: B 24 (1994), p.115.CrossRefGoogle Scholar
[7]Cooke, MS, Proceedings of the DPF-2011 Conference, Providence, RI, (2011)Google Scholar
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