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Inelastic STEM Imaging Based on Low-Loss Spectroscopy

  • Mark P. Oxley (a1) (a2), Myron D. Kapatenakis (a1) (a2), Micah P. Prange (a3), Wu Zhou (a2), Juan-Carlos Idrobo (a4), Stephen J. Pennycook (a5) and Sokrates T. Pantelides (a1) (a2)...
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Abstract

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References

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[1]Krivanek, O.L., et al., Nature 464 (2010), 571.
[2]Zhou, W., et al., Microsc. Microanal. 18 (2012), 1342.
[3]Zhou, W., et al., Phys. Rev. Lett. 109 (2012), 206803.
[4]Prange, M. P., et al., Phys. Rev. Lett. 109 (2012), 246101.
[5] This work was supported by DOE Grant No. DE-FG02-09R46554 (MPO, MDK), by the DOE Office of Basic Energy Sciences, Materials Sciences and Engineering Division, by NSF grant No. DMR-0938330 (WZ), by a Wigner Fellowship through the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle, LLC, for the U.S. DOE (WZ), and the Center for Nanophase Materials Sciences (CNMS), which is sponsored at ORNL by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE (JCI). This work used the resources of the National Energy Research Scientific Computing Center (Contract No. DE-AC02-05CH11231) and of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory (Contract No. DE-AC05-00OR22725), supported by the Office of Science of the U.S. DOE.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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