Hostname: page-component-8448b6f56d-t5pn6 Total loading time: 0 Render date: 2024-04-19T08:08:19.876Z Has data issue: false hasContentIssue false
  • English
  • Français

Inelastic STEM Imaging Based on Low-Loss Spectroscopy

Published online by Cambridge University Press:  27 August 2014

Mark P. Oxley ,
Myron D. Kapatenakis ,
Micah P. Prange ,
Wu Zhou ,
Juan-Carlos Idrobo ,
Stephen J. Pennycook  and
Sokrates T. Pantelides
Mark P. Oxley
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Myron D. Kapatenakis
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Micah P. Prange
Affiliation:
Fundamental and Computational Sciences Directorate, Pacific Northwest National Laboratory, Richland, WA, USA
Wu Zhou
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Juan-Carlos Idrobo
Affiliation:
Center for Nanophase Materials Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Stephen J. Pennycook
Affiliation:
Department of Materials Science and Engineering, University of Tennessee, Knoxville, TN, USA
Sokrates T. Pantelides
Affiliation:
Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 90 - 91
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Krivanek, O.L., et al., Nature 464 (2010), 571.Google Scholar
[2] Zhou, W., et al., Microsc. Microanal. 18 (2012), 1342.Google Scholar
[3] Zhou, W., et al., Phys. Rev. Lett. 109 (2012), 206803.Google Scholar
[4] Prange, M. P., et al., Phys. Rev. Lett. 109 (2012), 246101.Google Scholar
[5] This work was supported by DOE Grant No. DE-FG02-09R46554 (MPO, MDK), by the DOE Office of Basic Energy Sciences, Materials Sciences and Engineering Division, by NSF grant No. DMR-0938330 (WZ), by a Wigner Fellowship through the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory (ORNL), managed by UT-Battelle, LLC, for the U.S. DOE (WZ), and the Center for Nanophase Materials Sciences (CNMS), which is sponsored at ORNL by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. DOE (JCI). This work used the resources of the National Energy Research Scientific Computing Center (Contract No. DE-AC02-05CH11231) and of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory (Contract No. DE-AC05-00OR22725), supported by the Office of Science of the U.S. DOE.Google Scholar