Skip to main content
×
×
Home

Introduction: Special Issue on Atom Probe Tomography

  • Simon P. Ringer (a1), David J. Larson (a2), Michael P. Moody (a1), Michael K. Miller (a3) and Thomas F. Kelly (a2)...
Extract

In February 2006, in conjunction with the 19th Australian Conference on Microscopy and Microanalysis held in Sydney, the 2nd Australian Workshop on Atom Probe Tomography was convened by S.P. Ringer, M.K. Miller, D.A. Saxey, and R. Zheng at the Australian Key Centre for Microscopy and Microanalysis at The University of Sydney. The topics covered at that workshop included specimen preparation; data acquisition and data analysis methods for atom probe tomography; applications to spinodal alloys, phase transformations, light metals, atomic clustering, and detection methods, as well as future directions of the science and technology of atom probe tomography. The presentations and discussions that took place at this workshop, which was attended by more than 30 people, provided the inspiration for this special issue of Microscopy and Microanalysis.

  • View HTML
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Introduction: Special Issue on Atom Probe Tomography
      Available formats
      ×
      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

      Introduction: Special Issue on Atom Probe Tomography
      Available formats
      ×
      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

      Introduction: Special Issue on Atom Probe Tomography
      Available formats
      ×
Copyright
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed