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Investigation of the Use of Stereo-Pair Data Sets in Electron Tomography Characterization of Organic-Based Solar Cells

Published online by Cambridge University Press:  27 August 2014

Jessica A. Alexander
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States
Michael F. Durstock
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
Christopher E. Tabor
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
Benjamin J. Leever
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
Lawrence F. Drummy
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States
Michael D. Clark
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States UES, Inc., Dayton, Ohio 45432, United States
Dennis P. Butcher
Affiliation:
Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Ohio 45433, United States UES, Inc., Dayton, Ohio 45432, United States
Frank J. Scheltens
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States
David W. McComb
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, College Road, Columbus OH 43210, United States

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Atwater, H. A., Polman, A. Nature Materials 9 (2010), p. 205.Google Scholar
[2] Ferry, V.E., Munday, J.N., Atwater, H.A. Advanced Materials 22 (2010), p. 4794.Google Scholar
[3] The authors acknowledge the Air Force Office of Scientific Research and the Air Force ResearchLaboratory Matierals and Manufacturing Directorate for funding as well as The Ohio State UniversityCenter for Electron Microscopy and Analysis for technical support.Google Scholar