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Is HRTEM Image Simulation Correct? A Premise-Free Calibration Approach

Published online by Cambridge University Press:  25 July 2016

Andreas Thust ,
Juri Barthel  and
Chun-Lin Jia
Andreas Thust
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Peter Grunberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
Juri Barthel
Affiliation:
Central Facility for Electron Microscopy, RWTH Aachen University, 52074 Aachen, Germany
Chun-Lin Jia
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany Peter Grunberg Institute, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1390 - 1391
Copyright
© Microscopy Society of America 2016 

References

References:

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[4] Jia, CL, et al, Microsc. Microanal 19 (2013). p. 310.Google Scholar
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[6] Van Dyck, D, et al, Micron 68 (2014). ). p. 158.Google Scholar