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Layer-number-dependent Optical and Electrical Properties of Graphene on ZnO

  • Yi-Hang Ku (a1) (a2), Lo-Yueh Chang (a1), Hung-Wei Shiu (a1), Yen-Chien Kuo (a1), Shangjr Gwo (a1) (a2), Chi-Liang Chen (a1) and Chia-Hao Chen (a1)...
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Abstract
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Corresponding author
* Corresponding authors, chen.cl@nsrrc.org.tw (CLC) and chchen@nsrrc.org.tw (CHC)
References
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[1] Tung, R. T. Phys. Rev. B 45, 13509 1992.
[2] Brillson, L. J. Lu, Y. J. App. Phys. 109, 121301 2011.
[3] Sharma, B. L. Metal-Semiconductor Schottky Barrier Junctions and Their Applications. Springer-Verlag New York Inc. 2012.
[4] Mueller, T., Xia, F. Avouris, P. Nature Photonics 4, 297 2010.
[5] Hwang, S. W., et al, Phys. Rev. Lett. 105, 127403 2010.
[6] Hwang, E. H., et al, Phys. Rev. Lett. 98, 186806 2007.
[7] Shiu, H. W., et al, App. Phys. Lett. 103, 081604 2013.
[8] Shiu, H. W., et al, J. App. Phys. 113, 043701 2013.
[9] The authors thank the NSRRC beamline staff for their skillful assistance during the experiments. This work was partially financial supported by the Ministry of Science and Technology of Taiwan.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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