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Local Current-activated Growth of Nanometric Nickel Pillars During In situ STM-TEM Experiments

Published online by Cambridge University Press:  09 October 2013

K. van Benthem
Affiliation:
J.F. Rufner
Affiliation:
C.S. Bonifacio
Affiliation:
T.B. Holland
Affiliation:
R.H. Castro
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013