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Mass-Thickness Measurements in the TEM via EDS: A New Approach to Quantitative Chemical Analysis of Planetary Materials?

Published online by Cambridge University Press:  01 August 2018

Thomas J. Zega ,
Jane Y. Howe ,
James Sagar ,
Philippe Pinard  and
Rachel Koch
Thomas J. Zega
Affiliation:
Lunar and Planetary Laboratory, University of Arizona, Tucson, USA. Materials Science and Engineering, University of Arizona, Tucson, USA.
Jane Y. Howe
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
James Sagar
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Philippe Pinard
Affiliation:
Oxford Instruments NanoAnalysis, High Wycombe, UK.
Rachel Koch
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 2084 - 2085
Copyright
© Microscopy Society of America 2018 

References

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[8] We gratefully acknowledge NASA (grants #NNX12AL47G and #NNX15AJ22G) and NSF (grants #1531243 and #0619599) for funding of instrumentation in the Kuiper Materials Imaging and Characterization Facility at the Lunar and Planetary Laboratory, University of Arizona. Research supported by NASA grant #NNX15AJ22G.Google Scholar