Hostname: page-component-76fb5796d-zzh7m Total loading time: 0 Render date: 2024-04-25T18:58:32.381Z Has data issue: false hasContentIssue false
  • English
  • Français

Measurement of Optical Excitations in Low-Dimensional Materials by Using a Monochromated Electron Source

Published online by Cambridge University Press:  01 August 2018

Ryosuke Senga ,
Thomas Pichler  and
Kazu Suenaga
Ryosuke Senga
Affiliation:
Nano-Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan
Thomas Pichler
Affiliation:
Faculty of Physics, University of Vienna, Vienna, Austria
Kazu Suenaga
Affiliation:
Nano-Materials Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1574 - 1575
Copyright
© Microscopy Society of America 2018 

References

[1] Crochet, J. J., et al, Nature Nanotech 7 2012 126.Google Scholar
[2] Miyauchi, Y., et al, Natute Photo 7 2013 715.Google Scholar
[3] Bourrellier, R., et al, Nano Lett. 16 2016 4317.Google Scholar
[4] Tizei, L. H. G., et al, Phys. Rev. Lett. 114 2015 107601.Google Scholar
[5] Lin, J., et al, Nano Lett. 16 2016 7198.Google Scholar
[6] Sato, Y. Terauchi, M. Microsc. Microanal. 20 2014 807.Google Scholar
[7] Senga, R., et al, Nano Lett. 16 2016 3661.Google Scholar
[8] Hage, F. S., et al, Phys. Rev. B 95 2017 195411.Google Scholar
[9] Wei, X., et al, Nature Comm 7 2016 12899.Google Scholar
[10] RS acknowledge funding from JSPS KAKENHI, 17H04797. Dr. H Kataura is thanked for their sample preparations..Google Scholar