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Measuring Single Electrons – What Does it Mean?

Published online by Cambridge University Press:  05 August 2019

Henning Ryll*
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Martin Huth
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Robert Ritz
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Colum M. O'Leary
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Ian Griffiths
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Peter Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Ryusuke Sagawa
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd., 3-1-2 Musashino Akishima Tokyo 196-8558, Japan
Heike Soltau
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
Lothar Strüder
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 München, Germany
*
*Corresponding authors: henning.ryll@pnsensor.de
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Revealing the Fundamental Structure of Soft and Hard Matter by Minimizing Beam-Sample Interactions
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ryll, H., et al. , Journal of Instrumentation 11 (2016)CrossRefGoogle Scholar
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