Hostname: page-component-76fb5796d-dfsvx Total loading time: 0 Render date: 2024-04-25T14:36:28.441Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

Published online by Cambridge University Press:  05 August 2019

J. Miao ,
L. Casalena ,
J. Ciston ,
T. Pekin ,
M. Ghazisaeidi  and
M. J. Mills
J. Miao
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
L. Casalena
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
J. Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA.
T. Pekin
Affiliation:
Institut für Physik, Humboldt-Universität zu Berlin, Berlin, Germany.
M. Ghazisaeidi
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
M. J. Mills*
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, USA. Department of Materials Science and Engineering, The Ohio State University, Columbus, USA.
*
*Corresponding author: mills.108@osu.edu

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1834 - 1835
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ophus, C et al. , Microscopy and Microanalysis 20 (2014), p. 62.Google Scholar
[2]Ozdol, VB et al. , Applied Physics Letters 106 (2015), p. 253107.Google Scholar
[3]Miao, J et al. , Microscopy and Microanalysis 24 (2018), p. 2202.Google Scholar
[4]Miao, J et al. , Acta Materialia 132 (2017), p. 35.Google Scholar
[5]The authors acknowledge financial support from The National Science Foundation, Division of Materials Research under contract # #DMR-60050072. Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. JC acknowledges support from the DOE Early Career Research Program.Google Scholar