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    Cohen-Tanugi, David and Yao, Nan 2008. Superior imaging resolution in scanning helium-ion microscopy: A look at beam-sample interactions. Journal of Applied Physics, Vol. 104, Issue. 6, p. 063504.
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Mitigation of Localized Charging Induced in Insulating Materials by a Focused Ion Beam

  • Marion A. Stevens-Kalceff (a1) and Katie J. Levick (a1)
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Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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© 2004 Microscopy Society of America
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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