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Model of Fluctuation Electron Microscopy for a Nanocrystal /Amorphous Composite

  • F Yi (a1), WG Stratton (a1) and PM Voyles (a1)
Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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