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Modeling Secondary Electron Imaging at Atomic Resolution Using a Focused Coherent Electron Probe

Published online by Cambridge University Press:  27 August 2014

L. J. Allen
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
H. G. Brown
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
A. J. D’ Alfonso
Affiliation:
School of Physics, University of Melbourne, Parkville, Victoria 3010, Australia
J. Ciston
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley,California 94720, USA
Y. Lin
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208, USA
L. D. Marks
Affiliation:
Department of Materials Science and Engineering, Northwestern University, 2220 Campus Drive, Evanston, Illinois 60208, USA
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Abstract

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Copyright
Copyright © Microscopy Society of America 2014 

References

Zhu, Y, et al, Nat. Mater. 8 (2009) p. 808.
Seiler, H J. Appl. Phys. 54 (1983) p. R1.
Brown, HG, et al., Phys. Rev. B 87 (2013) 054102.
Howie, A, Microsc, J 180 (1995) p.192.
This research was supported under Australian Research Council’s Discovery Projects funding scheme (Project No. DP110102228).
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