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Nanoprobe Endstation with Montel optics and Resolution 50 nm at Taiwan Photon Source

  • Gung-Chian Yin (a1), Bo-Yi Chen (a1), Chien-Yu Lee (a1), Huang-Yeh Chen (a1), Bi-Hsuan Lin (a1), Shao-Chin Tseng (a1), Xiao-Yun Li (a1), Jian-Xing Wu (a1), Shi-Hung Chang (a1) and Mau-Tsu Tang (a1)...
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Abstract
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Corresponding author
*Corresponding author, gcyin@nsrrc.org.tw
References
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[1] Yin, G.-C., et al, AIP Conference Proceedings 1696 2016 020026.
[2] Yin, G.-C., et al Proc. SPIE 9592, X-Ray Nanoimaging: Instruments and Methods. II, 959204.
[3] Liu, W., et al, Journal of Synchrotron Radiation 18 2011 575579.
[4] Liu, C., et al, Applied Surface Science 258 2012 21822186.
[5] Yamauchi, K., et al, Review of Scientific Instruments 73 2002 40284033.
[6] Chen, B.Y., et al, MEDSI2016 Proccedings 2017 5759.
[7] Lin, B.-H., et al, Applied Physics Letters 109 2016 192104.
[8] Lin, B.-H., et al, Optics express 26, 27312739, 2018.
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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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